Sr. Failure Analysis Engineer, Microelectronics (Starlink)

About the Role

As a Sr. Failure Analysis Engineer on the Starlink team, you will perform detailed root cause failure analysis on microelectronic components and packaging to support high-volume manufacturing, qualification, and field returns. You will leverage advanced laboratory tools and physics-of-failure techniques to identify failure mechanisms and drive corrective actions that improve the reliability of our satellite constellation and user terminals.

Responsibilities

• Own end-to-end root cause failure analysis investigations on microelectronics failing in manufacturing, test, and field, from initial failure characterization through final corrective action verification
• Conduct advanced electrical fault isolation and characterization using curve trace, TDR, RF characterization, Lock-in Thermography, OBIRCH, EBIRCH, EBAC, nanoprobing, and related techniques to precisely localize defects in complex devices
li>Perform advanced physical failure analysis using SEM, FIB, EDS, SAM, cross-sectioning, and related techniques to identify failure mechanisms in silicon, packaging, and interconnects
• Apply physics-of-failure principles and deep knowledge of semiconductor failure modes (electromigration, thermal fatigue, delamination, EOS/ESD, solder joint fatigue, etc.) to determine root causes
• Drive corrective actions by working directly with silicon design, packaging, and manufacturing teams to implement and validate design or process changes based on FA findings
• Author detailed technical reports documenting failure modes, root cause conclusions, supporting data, and corrective action effectiveness
• Develop and improve failure analysis techniques and workflows to support new packaging technologies and advanced materials

Qualifications

• Bachelor’s degree in materials science, electrical engineering, physics, chemical engineering, or other STEM discipline
• 5+ years of hands-on experience in microelectronics failure analysis or materials characterization (internship experience is applicable)

Preferred Skills and Experience

• Master’s or PhD in materials science, electrical engineering, physics, chemical engineering, or other STEM discipline with a focus on microelectronics or failure analysis
• 10+ years of hands-on experience in microelectronics failure analysis or materials characterization
• Direct experience with failure analysis tools and techniques (SEM, FIB, EDS, cross-sectioning, fault isolation, or equivalent)
• Strong understanding of semiconductor physics and common microelectronics failure mechanisms (electromigration, thermal fatigue, delamination, solder joint fatigue, electrical overstress/ESD, etc.)
• Proficiency with advanced FA tools including SEM, FIB, SAM, and EDS
• Hands-on experience in electrical characterization and fault isolation techniques such as IV curves, RF/VNA measurement, LIT, OBIRCH, EBIRCH, EBAC, nanoprobing, photon emission, or voltage contrast
• Experience applying JEDEC and AEC reliability test standards and physics-of-failure methodologies to root cause investigations
• Experience analyzing complex datasets with Python, JMP, or similar tools
• Excellent problem-solving, communication, and technical writing skills

Additional Requirements

• Ability to work overtime and weekends as needed
• Ability to work in a cleanroom or ESD-controlled environment when required

To conform to U.S. Government export regulations, applicant must be a (i) U.S. citizen or national, (ii) U.S. lawful, permanent resident (aka green card holder), (iii) Refugee under 8 U.S.C. 1157, or (iv) Asylee under 8 U.S.C. 1158, or be eligible to obtain the required authorizations from the U.S. Department of State.