Materials Scientist, Dual Beam Analysis

About the role

Eurofins EAG Laboratories has over 40 years of experience in engineering and materials testing services. Our parent company, Eurofins Scientific, is a multi‑billion‑dollar global leader in engineering and scientific services operating over 950 labs in 60 countries with 65,000 employees and a portfolio of over 200,000 validated analytical methods. At EAG, curiosity fuels everything we do—every analysis, test, and question helps unlock what materials and products are capable of and what the world can build next. Our scientists and engineers support industries ranging from semiconductors and advanced electronics to pharmaceuticals, medical devices, energy systems, and consumer products, using advanced techniques in analytical chemistry, microscopy, surface analysis, and engineering sciences to solve complex challenges across the product lifecycle. What sets EAG apart is our people: problem solvers, collaborators, and lifelong learners who value precision, curiosity, and impact. Your work directly influences the safety, reliability, and performance of products used around the globe. Join our innovative Dual Beam Analysis team, where you'll work with state‑of‑the‑art microscopy tools to support imaging and materials analysis of client samples. We're seeking a skilled Scientist with expertise in Dual Beam FIB/SEM technology to play a critical role in advanced microscopy investigations. In this role, you'll prepare high‑quality TEM lamella, perform SEM imaging and EDS analysis on FIB cross‑sections to support detailed structural, compositional, and failure analysis for clients across diverse industries. You'll also contribute to critical dimension (CD) measurements, process optimization, and work closely with cross‑functional teams to deliver timely analytical results for a wide range of semiconductor and materials characterization projects. The ideal candidate is a strong technical contributor who enjoys working directly with advanced tools, thrives in a collaborative, fast‑paced laboratory environment, and takes pride in delivering results for clients.

Responsibilities

• Support FIB/SEM operation, including TEM lamella preparation and FIB‑SEM/EDS analysis.
• Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep, cross‑sectioning, and imaging.
• Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
• Perform image processing and analysis on 2D/3D FIB/SEM datasets.
• Improve throughput, repeatability, and data quality of Dual Beam services.
• Collaborate with cross‑functional teams to solve failure analysis and materials characterization challenges.
• Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.

Requirements

• Ability to continuously operate a personal computer or lab equipment for extended periods of time (4 or more hours).
• Ability to operate a keyboard and other lab equipment, use a telephone, access file cabinets and other items stored at various levels, including overhead.
• Ability to communicate clearly and understandably ensure an accurate exchange of information in normal conversational distance, over the telephone, and in a group setting.
• Ability to handle small and fragile devices with tweezers and/or fingers.
• Require close distance visual acuity with or without correction (Glasses, Contacts, etc.).
• Must be able to remain in a stationary position 80% of the time.

Qualifications

• MS or PhD in Materials Science and Engineering or related field or equivalent industrial experience.
• In‑depth knowledge of electron microscopy; Dual Beam (FIB/SEM) imaging.
• Expert with SEM/EDX, or TEM