Materials Analyst, Microscopy

About the role

The Advanced Microscopy team is seeking a Materials Analyst to join our Dual Beam (SEM-FIB) group in Raleigh, NC. This is a hands-on, production-focused role centered on TEM lamella preparation using Dual Beam FIB tools, supporting advanced materials and semiconductor analysis for clients across multiple industries.

Responsibilities

• Preparing high-quality, site-specific TEM lamella using Dual Beam FIB-SEM systems on novel materials and advanced semiconductor devices.
• Performing SEM imaging to support sample navigation, preparation, and quality verification.
• Managing multiple client samples, ensuring adherence to internal quality standards and turnaround commitments.
• Working closely with your team to optimize workflows, improve efficiency, and maintain consistent output.
• Collaborating with internal analytical teams and, as needed, clients to understand analysis requirements and standardized procedures.

Qualifications

• Bachelor’s or Master’s degree in Materials Science & Engineering or a related field, or equivalent industry experience.
• This position is designed for early-to-mid career professionals (BS/MS level) and is not aligned with PhD-level candidates.
• Hands-on experience operating Dual Beam FIB-SEM systems, OR strong academic/early-industry exposure with demonstrated capability to independently execute sample preparation workflows.
• Working knowledge of electron microscopy principles (SEM/TEM).
• General understanding of semiconductor device physics and failure analysis concepts gained through coursework, lab work, or prior industry experience.
• Strong problem-solving skills and the ability to manage priorities in a fast-paced, deadline-driven lab environment.

What Would Set You Apart

• Demonstrated expertise in TEM lamella preparation, including lift-out and site-specific techniques.
• Advanced SEM imaging experience.
• Prior experience supporting high-throughput or production laboratory environments.
• Clear, timely technical communication with internal teams and external clients.

Work Schedule

Tuesdays to Saturdays, 5pm-2am (10% evening shift differential will apply)

Qualifications

• All considered applicants must be a U.S. Citizen.
• Bachelor’s or Master’s degree in Materials Science & Engineering or a related field, or equivalent industry experience.
• This position is designed for early-to-mid career professionals (BS/MS level) and is not aligned with PhD-level candidates.
• Hands-on experience operating Dual Beam FIB-SEM systems, OR strong academic/early-industry exposure with demonstrated capability to independently execute sample preparation workflows.
• Working knowledge of electron microscopy principles (SEM/TEM).
• General understanding of semiconductor device physics and failure analysis concepts gained through coursework, lab work, or prior industry experience.
• Strong problem-solving skills and the ability to manage priorities in a fast-paced, deadline-driven lab environment.