APTM Yield Analysis/Device Engineer

Responsibilities

• Extract insights from structured and unstructured data by quickly synthesizing large volumes of data, applying statistical methods and machine learning techniques.
• Develop solutions to problems by utilizing formal education, knowledge of manufacturing process, statistical knowledge, and problem-solving tools.
• Independently drive recommendations and influence the Yield improvement roadmap.
• Good understanding of the relationship between electrical and physical fails including a deep knowledge of FIFA, DFT, Sort/Test, Integration/Process Flow, Datamining, Databases, Data manipulation, and Data visualization.
• Good understanding of Inline Defect Metrology, detection capabilities and underlying defect systems in the factory.
• Developing strong partnerships with diverse groups such as Process Engineering, Integration, QNR, and Product and Test Development Engineering.
• Preparing detailed, clear, and timely reports summarizing the yield and device health.
• Owning determining the actions required to deliver Best in Class yield levels.
• Developing solutions to problems using process, Sort/Test and inline metrology knowledge, statistical knowledge, and problem-solving skills.
• Working with both upstream, downstream and cross-functional key partners to ensure successful technology development, transfer and ramp of new technology into HVM.

Qualifications

• Possess a Bachelor's degree with 4+ years of relevant experience; OR a Master's degree with 3+ years of relevant experience; OR a PhD degree in Materials Science and Engineering or Mechanical Engineering or Computer Science or Information Systems or Chemical Engineering or Electrical Engineering or Chemistry or Physics or any other related discipline.
• 5+ years of experience in data analysis through JMP, Python, or other data engineering software.
• Understanding and hands-on application of statistical analysis.
• Demonstrated proficiency in structured technical problem-solving.
• Demonstrated understanding of product design/circuit/architecture as relevant for yield analysis.
• Demonstrated understanding of inline metrology capabilities as relevant for yield analysis.